Test Generation Algorithm for Analog Circuits Based on Extreme Learning Machine

In order to improve the efficiency and guarantee the precision of test generation algorithm for analog circuit,a extreme learning machine based test generation algorithm is proposed in this paper. Firstly, this algorithm saves time efficiently by using extreme learning machine to classify the pulse response space; Secondly a new process of test signal generator and structure of test in test generation algorithm are presented; and finally, the abovementioned improvement is confirmed in experiments.