ZHANG Yongchao, YOU Feng, WANG Weiwei, ZHAO Ruilian, SHANG Ying. Multi-objective selection of analog circuit test points based on fault aliasing degree[J]. Microelectronics & Computer, 2022, 39(9): 80-88. DOI: 10.19304/J.ISSN1000-7180.2022.0128
Citation: ZHANG Yongchao, YOU Feng, WANG Weiwei, ZHAO Ruilian, SHANG Ying. Multi-objective selection of analog circuit test points based on fault aliasing degree[J]. Microelectronics & Computer, 2022, 39(9): 80-88. DOI: 10.19304/J.ISSN1000-7180.2022.0128

Multi-objective selection of analog circuit test points based on fault aliasing degree

  • Test node selection methods in testability design of analog circuits usually use a voltage threshold to determine the fuzzy gap of all faults, but in fact, the voltage gap required by different faults is different.And for the voltage threshold setting problem, a clustering-based fault confusion calculation method is proposed to measure the degree of ambiguity between faults.On this basis, a multi-objective measurement point selection method for analogue circuits is designed to balance the number of measurement points and the number of faults isolated in order to obtain the maximum number of faults isolated with the lowest possible number of measurement points; Firstly, wavelet packet transform is used to extract the characteristics of analog signal. Then the aliasing degree between different faults is calculated by clustering; Finally, aiming at the fault isolation degree and the number of test points, the non-dominated sorting genetic algorithm NSGA-Ⅱ is used to search the test point set to realize the test point selection of analog circuit. The experimental results show that compared with the existing measurement point selection methods, this method can obtain the maximum number of fault isolation when the number of measurement points is as small as possible, and realize the optimization of measurement points.
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