孙杰杰, 徐海铭, 胡小琴, 于跃, 袁同伟, 潘滨, 胡永强. 一种星用高可靠性MTM反熔丝PROM存储单元[J]. 微电子学与计算机, 2016, 33(12): 89-92.
引用本文: 孙杰杰, 徐海铭, 胡小琴, 于跃, 袁同伟, 潘滨, 胡永强. 一种星用高可靠性MTM反熔丝PROM存储单元[J]. 微电子学与计算机, 2016, 33(12): 89-92.
SUN Jie-jie, XU Hai-ming, HU Xiao-qin, YU Yue, YUAN Tong-wei, PAN Bin, HU Yong-qiang. A MTM Antifuse PROM Bitcell With a High Reliability for Satellite Use[J]. Microelectronics & Computer, 2016, 33(12): 89-92.
Citation: SUN Jie-jie, XU Hai-ming, HU Xiao-qin, YU Yue, YUAN Tong-wei, PAN Bin, HU Yong-qiang. A MTM Antifuse PROM Bitcell With a High Reliability for Satellite Use[J]. Microelectronics & Computer, 2016, 33(12): 89-92.

一种星用高可靠性MTM反熔丝PROM存储单元

A MTM Antifuse PROM Bitcell With a High Reliability for Satellite Use

  • 摘要: 提出了一种新型的, 可用于卫星及其他航天器的高可靠性MTM反熔丝PROM存储单元, 并围绕该存储单元, 研究了其编程方式.实验表明, 在PROM电路中采用该存储单元, 且按照所述的编程方式, 可以在编程过程中对未选中反熔丝实施有效保护, 进而提高PROM芯片整体的可靠性和使用寿命.

     

    Abstract: In this paper, a novel MTM anti-fuse PROM bitcell with a high reliability is proposed, which can be used in stars and other spacecrafts. Based on this bitcell, programming and verification methods are studied. The use in PROM of the bitcell with the programming method described in this paper, can offer an effective protection to unselected anti-fuses in the programming process, therefore the reliability and working life of the PROM are improved.

     

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