戴睿, 蒋见花, 周玉梅. 组合电路瞬态故障敏感性量化分析方法[J]. 微电子学与计算机, 2014, 31(9): 48-53.
引用本文: 戴睿, 蒋见花, 周玉梅. 组合电路瞬态故障敏感性量化分析方法[J]. 微电子学与计算机, 2014, 31(9): 48-53.
DAI Rui, JIANG Jian-hua, ZHOU Yu-mei. Quantitative Approach for Transient-Faults Susceptibility Analysis in Combinational Circuits[J]. Microelectronics & Computer, 2014, 31(9): 48-53.
Citation: DAI Rui, JIANG Jian-hua, ZHOU Yu-mei. Quantitative Approach for Transient-Faults Susceptibility Analysis in Combinational Circuits[J]. Microelectronics & Computer, 2014, 31(9): 48-53.

组合电路瞬态故障敏感性量化分析方法

Quantitative Approach for Transient-Faults Susceptibility Analysis in Combinational Circuits

  • 摘要: 为了快速而有效地预测组合电路瞬态故障(Transient Fault,TF)敏感性,提出了一种基于分析模型的瞬态故障敏感性分析方法.采用一种生成脉冲的预特征化方法保证了脉冲生成的精确性;提出了一种基于块的传播算法处理瞬态脉冲传播过程中的屏蔽和衰减效应.基于以上各方法的优势,实现和验证了瞬态故障敏感性的量化分析工具TFSA (Transient-Faults Susceptibility Analysis).ISCAS基准电路的分析结果显示TFSA取得了与同类文献类似的分析结果,对规模较大的电路分析速度上有明显的提升,在高可靠电路设计过程中TFSA可以对瞬态故障敏感性进行有效预测.

     

    Abstract: A Quantitative approach based on analytical-model is proposed to quickly and accurately predict Transient Fault (TF) Susceptibility in combinational circuits.Accurate pulse generation model is relied on a precharacterization method,while a block-based algorithm,appropriately taking into consideration the attenuation and masking effects,is proposed for the analysis of pulse propagation.Taking advantage of these methods,we implement and validate a Transient-Faults Susceptibility Analysis (TFSA) tool.Experimental results on ISCAS benchmark circuits show TFSA achieves good accuracy compared to previous works,with notable speed-up for larger circuits,which can provide efficiently TF Susceptibility prediction for high-reliable circuits design.

     

/

返回文章
返回