李德明, 叶进. 基于配置前置约束算法的NP测试系统的研究[J]. 微电子学与计算机, 2013, 30(5): 63-66.
引用本文: 李德明, 叶进. 基于配置前置约束算法的NP测试系统的研究[J]. 微电子学与计算机, 2013, 30(5): 63-66.
LI De-ming, YIE Jin. Research of NP Auto-testing System Based on Pre-configuration Condition Constrains Algorithm[J]. Microelectronics & Computer, 2013, 30(5): 63-66.
Citation: LI De-ming, YIE Jin. Research of NP Auto-testing System Based on Pre-configuration Condition Constrains Algorithm[J]. Microelectronics & Computer, 2013, 30(5): 63-66.

基于配置前置约束算法的NP测试系统的研究

Research of NP Auto-testing System Based on Pre-configuration Condition Constrains Algorithm

  • 摘要: 本文在介绍了现有主流自动测试系统的相关技术基础之上,针对网络处理器的工作特点,设计了一款具有基于配置前置约束的用例自动生成算法的关键字驱动的NP自动化测试系统.实现了从测试用例自动生成、测试序列自动生成、自动执行测试到输出测试结果的全自动NP测试系统框架,在实际对比应用中,由于采用了用例自动生成技术,该测试系统在测试效率和检出问题方面均比原有半自动测试系统有大幅度的提升,并取得了良好的应用效果.

     

    Abstract: This paper describes related technologies used by the existing mainstream automated test systems,and proposed and designed a keyword-driven NP automated testing system with pre-configuration constraints testing case automatic generation algorithm.The system realized all procedure from the automatic generation of case, automatically generate the test sequence,and automatically performs the test to the output test results automatically.By actually contrast applications,due to the technology of test case automatic generation,the system significantly improved test efficiency and ability of problem-detection than the original test system.

     

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