沈欣, 陈良权, 高敏, 林媛. 基于FPGA的OCTA NOR Flash存储芯片高效测试方法[J]. 微电子学与计算机, 2019, 36(10): 65-67, 72.
引用本文: 沈欣, 陈良权, 高敏, 林媛. 基于FPGA的OCTA NOR Flash存储芯片高效测试方法[J]. 微电子学与计算机, 2019, 36(10): 65-67, 72.
shu
SHEN Xin, CHEN Liang-quan, GAO Min, LIN Yuan. A high efficiency testing method for OCTA NOR Flash memory device with FPGA[J]. Microelectronics & Computer, 2019, 36(10): 65-67, 72.
Citation: SHEN Xin, CHEN Liang-quan, GAO Min, LIN Yuan. A high efficiency testing method for OCTA NOR Flash memory device with FPGA[J]. Microelectronics & Computer, 2019, 36(10): 65-67, 72.
shu

基于FPGA的OCTA NOR Flash存储芯片高效测试方法

A high efficiency testing method for OCTA NOR Flash memory device with FPGA

    摘要
  • 摘要: 针对OCTA NOR Flash的测试占用接口多, 传统测试方法耗时较长的问题, 提出了一种基于I/O口共用的OCTA NOR Flash高效测试系统及方法, 以FPGA作为控制器, 将测试指令传输给多颗Flash芯片, FPGA接收Flash芯片传回的数据后经过处理, 可显示到相应的显示装置上.实际验证了系统的可行性.实际验证的结果表明, 在测试过程中, 数据传输稳定, 无误码.

     

    Abstract: Abased on I/O ports sharing high efficiency testing method for the testing of OCTA NOR Flash memory device is proposed.By using the FPGA as the controller, the testing instructions can be transmitted to multiple Flash memory devices and the testing data can be processed by FPGA and display to display device.The verification results also show stable and error-free data transmission can be realized in this method.

     

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