SoC的存储器Wrapper设计及故障测试

The Design of Wrapper and Fault Test For SoC Mememory

摘要: 在系统芯片SoC测试中,存储器的可靠性测试是一项非常重要内容.IEEE Std 1500是专门针对嵌入式芯核测试所制定的国际标准,规范了IP核提供者和使用者之间的标准接口.基于此标准完成针对SoC存储器的Wrapper测试壳结构和控制器的设计.以32×8的SRAM为测试对象进行测试验证.结果表明,系统能够准确的诊断出存储器存在故障.

Abstract: In the testing of system on chips(SoC),the reliability testing for the memory is very important.The IEEE Std 1500 is a international standard that is specially instituted for embedded core testing,it establishes the standard interface between the providers and users of the IP cores.The design for the Wrapper architecture and controller of the SoC memory is based on the IEEE Std 1500.This paper validates the SRAM as the test object.And the results indicate that the system can diagnose the faults in the memory accurately.