Abstract: This paper presents a general, low cost embedded IP core testing method based on IEEE standards. Only by redefining the number and name of under-test IP cores, the method can automatically generate test wrappers for various digital IP cores. The test wrapper supports all 11 instructions specified in the IEEE 1500 standard, thereby providing ample IP core test control and observation modes. The test software is IEEE1687-compatible, when the IP core is tested in different SOC designs, it can automatically complete the test and extract diagnostic information without modifying the test pattern. In order to verify this method, we implemented and tested a variety of heterogeneous IP cores and a large number of homogeneous IP cores on FPGA. This test method simplifies the test integration and reuse process of the digital IP cores by supporting mainstream IEEE test standards and providing a high degree of test automation.