Abstract: This paper proposes a new built-in self-test(BIST) scheme based on histogram to test analog-to-digital converter(ADC) static parameters,including the Offset Error,the Gain Error,the Integral Non-linearity(INL) and the Differential Non-linearity(DNL).The proposed BIST mainly consists of a waveform generate controller,a direct digital synthesizer(DDS) sine waveform generator,a triangle waveform generator and a CPU core.The triangular wave signal is used as the stimulus,generated by a triangle waveform generator.This ADC BIST scheme features that the waveform,the frequency,the initial phase can be reconfigured through programming.The BIST is implemented on a FPGA development board,and experiment results indicate that the BIST scheme can effectively test static parameters of ADCs.