刘辉华, 李平, 徐小良, 张宪. 一款抗SET电荷泵研究[J]. 微电子学与计算机, 2017, 34(6): 14-17.
引用本文: 刘辉华, 李平, 徐小良, 张宪. 一款抗SET电荷泵研究[J]. 微电子学与计算机, 2017, 34(6): 14-17.
LIU Hui-hua, LI Ping, XU Xiao-liang, ZHANG Xian. Research on A Single-Event-Hardened Charge Pump[J]. Microelectronics & Computer, 2017, 34(6): 14-17.
Citation: LIU Hui-hua, LI Ping, XU Xiao-liang, ZHANG Xian. Research on A Single-Event-Hardened Charge Pump[J]. Microelectronics & Computer, 2017, 34(6): 14-17.

一款抗SET电荷泵研究

Research on A Single-Event-Hardened Charge Pump

  • 摘要: 提出了一种新颖的抗单粒子瞬变效应(SET)电荷泵结构, 通过在电荷泵和低通滤波器间增加数控抑制电路(NCR), 对单粒子辐射产生的电流干扰脉冲进行实时抑制处理, 降低电流脉冲的幅度和宽度, 从而减少振荡器控制电压的波动, 降低系统的抖动, 采用130 nm CMOS工艺, 与未加固电路对比, 该电路可以降低电荷泵控制电流波动60%以上, 注入电流处频率稳定度达到8e-4.

     

    Abstract: A radiation-hardened charge pump has been proposed in which a novel numerical control restrain (NCR) circuit is applied to reduce the current perturbation and the clock jitter caused by the single energetic particle strikes. A hardened charge pump is implemented in a self-biased PLL with 130 nm CMOS process to verify the circuit and the corresponding results show that the peak of current perturbation reduces by up to 60% and the frequency stability reduces to 8e-4 compared with the traditional CP at the same time of current perturbation.

     

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