周恒, 李磊. 一种加固SRAM单元DDICE及外围电路设计[J]. 微电子学与计算机, 2015, 32(5): 68-72. DOI: 10.19304/j.cnki.issn1000-7180.2015.05.015
引用本文: 周恒, 李磊. 一种加固SRAM单元DDICE及外围电路设计[J]. 微电子学与计算机, 2015, 32(5): 68-72. DOI: 10.19304/j.cnki.issn1000-7180.2015.05.015
ZHOU Heng, LI Lei. A Hardened SRAM Cell-DDICE and Peripheral Circuits Design[J]. Microelectronics & Computer, 2015, 32(5): 68-72. DOI: 10.19304/j.cnki.issn1000-7180.2015.05.015
Citation: ZHOU Heng, LI Lei. A Hardened SRAM Cell-DDICE and Peripheral Circuits Design[J]. Microelectronics & Computer, 2015, 32(5): 68-72. DOI: 10.19304/j.cnki.issn1000-7180.2015.05.015

一种加固SRAM单元DDICE及外围电路设计

A Hardened SRAM Cell-DDICE and Peripheral Circuits Design

  • 摘要: 经典的DICE单元在非读写状态时具有高效抗单粒子翻转效应能力,但在读写状态下对单粒子轰击引起的单粒子瞬态却无能为力.基于DICE,提出新型DDICE结构,在互锁结构的基础上将读写线路分开,加入延时电路,并用位线和延时位线写入数据,使存储单元在读写状态下具有一定的抗单粒子效应能力,保证存储单元在静态和动态情况下免受单粒子效应的影响.同时,在译码电路中加入滤波单元,防止译码电路被单粒子轰击时,写入或读出错误数据.该设计对SRAM进行了多方位的加固,具有很强的抗单粒子效应能力.

     

    Abstract: The classic DICE unit possesses high efficiency of anti-SEU in the static state of SRAM, but it is incapable of resisting SET caused by single particle strike in the read-write cycle. This paper proposes a new structure Delay DICE (DDICE) based on DICE. It separates read and write lines on the basis of interlocking structure and add delay unit and delayed bit line to write data. This new memory cell has got the ability to immunize Single Event Transient in any working period besides anti-SEU. Furthermore a filtering unit is added to the decoding circuit which prevents writing or reading data to wrong storage cell when decoding circuit is hit by single particle. SRAM with this new structure will get a strong ability of anti-Single Event Effects and high security of data for the multiple aspects of hardening design.

     

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